JAIST Researchers Use Deep Learning to Unlock X-ray Diffraction Secrets
Deep learning can help in characterizing materials by analyzing peak changes in x-ray diffractions
XRD / XRF
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Bruker and DECTRIS Announce the Integration of the New EIGER2 R 250K Detector into the D8™ X-ray Diffraction Systems
The new EIGER2 R 250K with over 250,000 pixels incorporates the latest technological enhancements applied to the entire EIGER2 R family
Vanta™ iX In-Line XRF Analyzer Automates Material Analysis and Alloy ID
The instrument provides 100 percent inspection on the manufacturing line
Researchers Deconstruct Ancient Parchment Using Multiple Techniques
Analyses of the materials in the scrolls help put the object into an historical context and guides conservators in future restoration efforts
Forensic Identification of Single Dyed Hair Strand Now Possible
Scientists develop modern analytical techniques as a tool for advancing forensic investigations
New Technique Enables Mineral ID of Precious Antarctic Micrometeorites
Analyzing the composition of this type of cosmic dust can potentially reveal many secrets about the evolution of our solar system
