scanning transmission electron microscope

Study reveals interactions that could be used to enhance the mechanical performance of high- and medium-entropy alloys

Researchers bring nonlinear optical phenomena to electron microscopy

Built from the ground up for multimodal nano-characterization

All-in-one (S)TEM enables the understanding of complex samples for materials scientists and semiconductor manufacturers

Generates repeatable, high-quality semiconductor analysis to accelerate device development and maximize yields

Thermo Scientific Spectra delivers leading-edge atomic-level imaging and analysis in one tool

FAU scientist investigates fossilized remains of vertebrae

New compact S/TEM can be configured to meet specific imaging and analytical requirements for materials characterization in research laboratories

New platinum-based catalysts with tensile surface strain could improve fuel cell efficiency