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scanning electron microscopes

Advancements in Scanning Electron Microscopes

Explore the latest developments in electron microscopes, including improvements in detectors, sample holders, and software for enhanced usability and data quality

Purchasing Guide: Microscopy

by Lab Manager

First 4D-Scanning Transmission Electron Microscope

by TESCAN

a scanning transmission electron microscope sits on a lab bench bathed in blue and purple light with the inside of the microscope glowing green

Reimagining Electron Microscopy

by University of Illinois Grainger College of Engineering

Bringing high-end resolution to lower-cost microscopes

Scientist prepares a sample on a scanning electron microscope

How SEM/EDS Works and Its Applications in Materials Science

by Aimee Cichocki

This versatile technique offers insight into the structure and composition of a range of materials

closeup of microscope examining dollar bill

Electron Microscope Price, including Cost of 50 Different Models

by Damon Anderson, PhD

A comprehensive guide to electron microscope models, prices, and cost considerations

A SEM on a white background attached to a computer

New Scanning Electron Microscope with 'Simple SEM' Automation, 3D Analysis

by JEOL USA

New microscope especially suited for repetitive operations and quality control

An illustration of antibodies floating around in a black space. The antibodies are mostly blue, but there is a ring of pale orange ones in a ring around the center of the image.

FIB-SEM: A Versatile Nanoscale Laboratory Tool for Advanced Material Science

by Dean Miller, PhD, Senior Scientist, TESCAN USA, Inc.

Achieve a new level of 3D analysis through multi-modal characterization

What to Think About When Choosing a Microscope for Your Lab

Microscopy

by Lab Manager

What to think about when choosing a microscope for your lab

Moth wing captured at 5 keV using GSD detector and MultiVac on MAGNA SEM

TESCAN's New MultiVac Module Adds Conventional Low Vacuum and Variable Pressure Capabilities to TESCAN SEMs

by TESCAN

MultiVac improves efficiency for topographic characterization of non-conductive, beam-sensitive, or outgassing samples when using low keV imaging

Thermo Scientific Spectra Ultra Offers a Leap Forward for Advanced Materials Characterization

by Thermo Fisher Scientific

All-in-one (S)TEM enables the understanding of complex samples for materials scientists and semiconductor manufacturers

ZEISS Enhances its Field Emission SEMs for Highest Demands in Sub-Nanometer Imaging, Analytics, and Sample Flexibility

by ZEISS

The new ZEISS GeminiSEM family delivers more information from any sample, minimizes sample damage, and prevents sample artifacts

A Picture is Worth a Thousand Words: Microscopy Solutions

by Lab Manager

Join Lab Manager and our panel of experts as we discuss available microscope technology and how to choose the best tool for your lab